JT

Jun Takebayashi

TC Tokyo Seimitsu Co.: 1 patents #5 of 19Top 30%
Overall (2005): #165,569 of 245,428Top 70%
1
Patents 2005

Issued Patents 2005

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6867424 Wafer defect inspection machine having a dual illumination system Toshirou Kurosawa, Yuzo Katsuki 2005-03-15