AS

Akira Sawaoka

KT Kabushiki Kaisha Toshiba: 1 patents #604 of 1,959Top 35%
📍 Yokohama, NM: #1 of 1 inventorsTop 100%
Overall (2005): #241,921 of 245,428Top 100%
1
Patents 2005

Issued Patents 2005

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6901535 Information processing apparatus, defect analysis program, and defect analysis method Nobuyuki Yamauchi, Natsumi Matsumoto 2005-05-31