Issued Patents 2005
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6947520 | Beam centering and angle calibration for X-ray reflectometry | Isaac Mazor, David Berman | 2005-09-20 |
| 6907108 | Dual-wavelength x-ray monochromator | Isaac Mazor, Amos Gvirtzman | 2005-06-14 |
| 6895071 | XRR detector readout processing | Alexander Dikopoltsev, Isaac Mazor, David Berman | 2005-05-17 |
| 6895075 | X-ray reflectometry with small-angle scattering measurement | Alexander Dikopoltsev, Tzachi Rafaeli, Amos Gvirtzman | 2005-05-17 |