Issued Patents 2005
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6943870 | Deformation measuring method and apparatus using electronic speckle pattern interferometry | Satoru Toyooka | 2005-09-13 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6943870 | Deformation measuring method and apparatus using electronic speckle pattern interferometry | Satoru Toyooka | 2005-09-13 |