Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6917208 | Method and test structure for determining resistances at a plurality of interconnected resistors in an integrated circuit | Jürgen Lindolf | 2005-07-12 |
| 6856562 | Test structure for measuring a junction resistance in a DRAM memory cell array | Susanne Lachenmann, Valentin Rosskopf, Andreas Felber | 2005-02-15 |