Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6895538 | Method for testing a device and a test configuration including a device with a test memory | Alexander Benedix, Henning Hartmann, Wolfgang Ruf | 2005-05-17 |
| 6876217 | Method for testing semiconductor circuit devices | Stefan Dankowski, Alexander Benedix, Wolfgang Ruf | 2005-04-05 |