Issued Patents 2005
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6963813 | Method and apparatus for fast automated failure classification for semiconductor wafers | Dieter Rathei, Peter Oswald, Thomas Hladschik | 2005-11-08 |
| 6903959 | Sensing of memory integrated circuits | Thomas Roehr, Hans-Oliver Joachim, Norbert Rehm | 2005-06-07 |
| 6885597 | Sensing test circuit | Thomas Roehr, Hans-Oliver Joachim, Michael Jacob, Takashima Daisaburo | 2005-04-26 |
| 6856560 | Redundancy in series grouped memory architecture | Norbert Rehm, Hans-Oliver Joachim, Thomas Roehr | 2005-02-15 |