Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6977516 | Semi-conductor component testing system with a reduced number of test channels | Jesus Ferreira | 2005-12-20 |
| 6858447 | Method for testing semiconductor chips | Udo Hartmann, Peter Beer | 2005-02-22 |