Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6875692 | Copper electromigration inhibition by copper alloy formation | Shaulin Shue | 2005-04-05 |
| 6849173 | Technique to enhance the yield of copper interconnections | Shaulin Shue | 2005-02-01 |