Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6909296 | Wafer level system for producing burn-in/screen, and reliability evaluations to be performed on all chips simultaneously without any wafer contacting | William T. Motsiff, Edward J. Nowak | 2005-06-21 |
| 6844747 | Wafer level system for producing burn-in/screen, and reliability evaluations to be performed on all chips simultaneously without any wafer contacting | William T. Motsiff, Edward J. Nowak | 2005-01-18 |