Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6973607 | Method and apparatus for testing electronic components | Heinz Baier, Michael Criscolo, Pedro Martin-de-Nicolas, Michael T. Saunders, Kanti C. Shah | 2005-12-06 |
| 6904594 | Method and system for apportioning changes in metric variables in an symmetric multiprocessor (SMP) environment | John Day Howard, Frank Eliot Levine, Robert John Urquhart | 2005-06-07 |