Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6980009 | Structure for measurement of capacitance of ultra-thin dielectrics | Edward P. Maciejewski, Edward J. Nowak | 2005-12-27 |
| 6856031 | SRAM cell with well contacts and P+ diffusion crossing to ground or N+ diffusion crossing to VDD | Robert C. Wong | 2005-02-15 |