Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6893884 | Method and apparatus for measuring dopant profile of a semiconductor | Uttam Shyamalindu Ghoshal | 2005-05-17 |
| 6866415 | Scanning heat flow probe | Steven A. Cordes, David R. DiMilia, James P. Doyle, Matthew J. Farinelli, Snigdha Ghoshal +2 more | 2005-03-15 |