Issued Patents 2005
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6975124 | Multipoint nanoprobe | — | 2005-12-13 |
| 6943571 | Reduction of positional errors in a four point probe resistance measurement | — | 2005-09-13 |
| 6927569 | Techniques for electrically characterizing tunnel junction film stacks with little or no processing | Philip L. Trouilloud, David W. Abraham, Joerg Schmid | 2005-08-09 |