Issued Patents 2005
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6941235 | Method and system for analyzing quiescent power plane current (IDDQ) test data in very-large scale integrated (VLSI) circuits | — | 2005-09-06 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6941235 | Method and system for analyzing quiescent power plane current (IDDQ) test data in very-large scale integrated (VLSI) circuits | — | 2005-09-06 |