Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6909772 | Method and apparatus for thin film thickness mapping | Krzysztof Kozaczek, David S. Kurtz, Roger Isaac Martin, Patrick W. DeHaven, Kenneth P. Rodbell +1 more | 2005-06-21 |
| 6882739 | Method and apparatus for rapid grain size analysis of polycrystalline materials | David S. Kurtz, Kryzsztof J. Kozaczek | 2005-04-19 |