Issued Patents 2005
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6922803 | Test method of semiconductor intergrated circuit and test pattern generator | Kazumi Hatayama, Koichiro Natsume, Yoshikazu Kiyoshige, Masaki Kouno, Masato Hamamoto +2 more | 2005-07-26 |