Issued Patents 2005
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6957159 | System for analyzing compound structure | Kiyomi Yoshinari, Atsushi Otake | 2005-10-18 |
| 6926816 | Analysis method of film thickness distribution and design system of printed circuit board and manufacturing processes | Akihiro Sano | 2005-08-09 |
| 6917037 | Mass spectrum analyzing system | Atsushi Ootake, Kiyomi Yoshinari, Atsumu Hirabayashi, Izumi Waki | 2005-07-12 |
| 6914239 | System for analyzing mass spectrometric data | Kiyomi Yoshinari, Atsushi Otake, Toyoharu Okumoto | 2005-07-05 |
| 6907352 | Mass spectrometric data analyzing method, mass spectrometric data analyzing apparatus, mass spectrometric data analyzing program, and solution offering system | Kiyomi Yoshinari, Lee Chahn | 2005-06-14 |