Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6909798 | Method of erasing repeated patterns and pattern defect inspection device | Noriaki Yukawa, Yukihiro Ayaki | 2005-06-21 |
| 6853281 | Magnet apparatus and mri apparatus | Shigeru Kakugawa, Shouji Kitamura, Nobuhiro Hara, Akiyoshi Komura, Noriaki Hino +4 more | 2005-02-08 |