Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6885983 | Method for automatically searching for functional defects in a description of a circuit | Robert Kristianto Mardjuki, David Lansing Dill, Jing Chyuarn Lin, Ping Fai Yeung, Paul Estrada +5 more | 2005-04-26 |
| 6848088 | Measure of analysis performed in property checking | Jeremy Rutledge Levitt, Christophe Gauthron, Ping Fai Yeung, Kalyana C. Mulam, Ramesh Sathianathan | 2005-01-25 |