Issued Patents 2005
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6947871 | Yield/quality improvement using calculated failure rate derived from multiple component level parameters | Youping Deng, Christopher D. Keener | 2005-09-20 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6947871 | Yield/quality improvement using calculated failure rate derived from multiple component level parameters | Youping Deng, Christopher D. Keener | 2005-09-20 |