CC

Craig Alan Cantello

GE: 2 patents #225 of 2,265Top 10%
📍 Schenectady, NY: #21 of 129 inventorsTop 20%
🗺 New York: #1,066 of 8,003 inventorsTop 15%
Overall (2005): #59,933 of 245,428Top 25%
2
Patents 2005

Issued Patents 2005

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
6874932 Methods for determining the depth of defects John Devitt, Anthony Sebastian Bauco, Kevin George Harding 2005-04-05
6868371 System and method to quantify appearance defects in molded plastic parts Sandra F. Feldman, Andrew Joseph Poslinski, Harsha Mysore Hatti, James Louis Cifarelli, Kena Kimi Yokoyama +4 more 2005-03-15