Issued Patents 2005
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6965244 | High performance probe system | — | 2005-11-15 |
| 6965248 | Compensation for test signal degradation due to DUT fault | — | 2005-11-15 |
| 6948940 | Helical microelectronic contact and method for fabricating same | Scott E. Lindsey, David M. Royster, Stuart Wenzel | 2005-09-27 |
| 6949942 | Predictive, adaptive power supply for an integrated circuit under test | Benjamin N. Eldridge | 2005-09-27 |
| 6917210 | Integrated circuit tester with high bandwidth probe assembly | — | 2005-07-12 |
| 6911835 | High performance probe system | Matthew Chraft, Roy J. Henson, Chih-Chiang Tseng | 2005-06-28 |
| 6910268 | Method for fabricating an IC interconnect system including an in-street integrated circuit wafer via | — | 2005-06-28 |
| 6911814 | Apparatus and method for electromechanical testing and validation of probe cards | Emad B. Hreish | 2005-06-28 |
| 6891385 | Probe card cooling assembly with direct cooling of active electronic components | — | 2005-05-10 |
| 6882546 | Multiple die interconnect system | — | 2005-04-19 |
| 6882239 | Electromagnetically coupled interconnect system | — | 2005-04-19 |
| 6845491 | Method of designing, fabricating, testing and interconnecting an IC to external circuit nodes | John M. Long | 2005-01-18 |