Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6978411 | Memory test system for peak power reduction | Cheng-I Huang, Wang Chen, Jyh-Herny Wang | 2005-12-20 |
| 6895540 | Mux scan cell with delay circuit for reducing hold-time violations | Wang Chen, Cheng-I Huang | 2005-05-17 |