Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6904551 | Method and circuit for setup and hold detect pass-fail test mode | — | 2005-06-07 |
| 6850075 | SRAM self-timed write stress test mode | John Laurence Niven | 2005-02-01 |
CD
Colin Davidson
Overall (2005): #60,008 of 245,428Top 25%
2
Patents 2005