Issued Patents 2005
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6976234 | Apparatus and method for measuring characteristics of dynamic electrical signals in integrated circuits | — | 2005-12-13 |
| 6961672 | Universal diagnostic platform for specimen analysis | — | 2005-11-01 |
| 6956365 | System and method for calibration of testing equipment using device photoemission | Israel Niv | 2005-10-18 |
| 6891363 | Apparatus and method for detecting photon emissions from transistors | Romain Desplats, Patricia Le Coupanec, William Lo, Philippe Perdu | 2005-05-10 |
| 6859031 | Apparatus and method for dynamic diagnostic testing of integrated circuits | Nader Pakdaman, Itzik Goldberger | 2005-02-22 |