Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6887754 | Semiconductor device having a reduced leakage current and a fabrication process thereof | — | 2005-05-03 |
| 6884670 | Dry etching with reduced damage to MOS device | Koichi Hashimoto, Masaaki Aoyama | 2005-04-26 |