Issued Patents 2005
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6950355 | System and method to screen defect related reliability failures in CMOS SRAMS | Surya Battacharya, Ming-Chung Chen, Liming Tsau, Henry Chen | 2005-09-27 |
GS
Guang-Jye Shiau
Overall (2005): #194,797 of 245,428Top 80%
1
Patents 2005