Issued Patents 2005
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6937753 | Automated wafer defect inspection system and a process of performing such inspection | Jeffrey O'Dell, Mark Harless, Steve Herrmann | 2005-08-30 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6937753 | Automated wafer defect inspection system and a process of performing such inspection | Jeffrey O'Dell, Mark Harless, Steve Herrmann | 2005-08-30 |