Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6937048 | Method for testing an integrated circuit with an external potential applied to a signal output pin | Matthias Eichin | 2005-08-30 |
| 6937051 | Integrated circuit that can be externally tested through a normal signal output pin | Matthias Eichin | 2005-08-30 |