CL

Chiwoei Wayne Lo

Applied Materials: 1 patents #266 of 719Top 40%
📍 Campbell, CA: #67 of 174 inventorsTop 40%
🗺 California: #7,981 of 26,868 inventorsTop 30%
Overall (2005): #223,708 of 245,428Top 95%
1
Patents 2005

Issued Patents 2005

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6914441 Detection of defects in patterned substrates Christopher G. Talbot 2005-07-05