Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6950771 | Correlation of electrical test data with physical defect data | Yuezhen Fan, Jason Songbo Xu, Stephen Tang | 2005-09-27 |
| 6891395 | Application-specific testing methods for programmable logic devices | Robert W. Wells, Robert D. Patrie, Vincent L. Tong, Jae-Weon Cho, Shahin Toutounchi | 2005-05-10 |