Issued Patents 2005
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6956385 | Integrated circuit defect analysis using liquid crystal | David H. Eppes | 2005-10-18 |
| 6897664 | Laser beam induced phenomena detection | Gregory A. Dabney, Palaniappan Muthupalaniappan, Jiann Min Chin, Richard Wilcox, Glen Gilfeather +6 more | 2005-05-24 |
| 6894518 | Circuit analysis and manufacture using electric field-induced effects | Rama R. Goruganthu | 2005-05-17 |
| 6891390 | Circuit analysis using electric field-induced effects | Rama R. Goruganthu | 2005-05-10 |
| 6873166 | Localized heating for defect isolation during die operation | Richard W. Johnson, Rama R. Goruganthu | 2005-03-29 |
| 6870379 | Indirect stimulation of an integrated circuit die | Brennan V. Davis, Victoria J. Bruce, Rosalinda M. Ring, David H. Eppes | 2005-03-22 |
| 6864972 | IC die analysis via back side lens | Jeffrey D. Birdsley, Brennan V. Davis, Rosalinda M. Ring, Daniel L. Stone | 2005-03-08 |
| 6850081 | Semiconductor die analysis via fiber optic communication | Jeffrey D. Birdsley, Brennan V. Davis, Rosalinda M. Ring, Daniel L. Stone | 2005-02-01 |
| 6844928 | Fiber optic semiconductor analysis arrangement and method therefor | Glen Gilfeather, Srikar V. Chunduri, Brennan V. Davis, David H. Eppes, Victoria J. Bruce +2 more | 2005-01-18 |