Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6953755 | Technique for monitoring the state of metal lines in microstructures | Moritz Andreas Meyer, Eckhard Langer | 2005-10-11 |
| 6894390 | Soft error resistant semiconductor device | Gisela Schammler, Mathias Bottcher, Frank Kuechenmeister, Daniel Gehre | 2005-05-17 |