Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6912438 | Using scatterometry to obtain measurements of in circuit structures | Bhanwar Singh, Ramkumar Subramanian, Bharath Rangarajan | 2005-06-28 |
| 6884999 | Use of scanning probe microscope for defect detection and repair | Sanjay K. Yedur, Bhanwar Singh | 2005-04-26 |