Issued Patents 2005
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6899596 | Chemical mechanical polishing of dual orientation polycrystalline materials | Michael J. Antonell, Jennifer A. Antonell, Ryan Maynard, Darrell Simpson | 2005-05-31 |
| 6870950 | Method for detecting defects in a material and a system for accomplishing the same | Catherine Vartuli, Mike Antonell, Pam Cavanagh, Hui Ma | 2005-03-22 |