YF

Yasuo Furukawa

AD Advantest: 1 patents #20 of 85Top 25%
📍 Tokyo, CA: #111 of 208 inventorsTop 55%
Overall (2005): #73,940 of 245,428Top 35%
1
Patents 2005

Issued Patents 2005

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6894301 Method and apparatus for testing circuit using light emission — 2005-05-17