TH

Takahiro Housako

AD Advantest: 1 patents #20 of 85Top 25%
📍 Gyōda, JP: #11 of 43 inventorsTop 30%
Overall (2005): #93,812 of 245,428Top 40%
1
Patents 2005

Issued Patents 2005

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6865698 Method and apparatus for testing semiconductor devices — 2005-03-08