EK

Eiji Kimura

AD Advantest: 2 patents #5 of 85Top 6%
📍 Shibukawa, MI: #1 of 1 inventorsTop 100%
Overall (2005): #57,389 of 245,428Top 25%
2
Patents 2005

Issued Patents 2005

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
6954263 Optical characteristic measuring apparatus, method and recording medium Kenichi Nakamura, Takahisa Tomi 2005-10-11
6864967 Optical characteristic measuring apparatus, method and recording medium 2005-03-08