Issued Patents 2004
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6836335 | Multi-axis interferometer | Henry A. Hill, Andrew Eric Carlson | 2004-12-28 |
| 6822745 | Optical systems for measuring form and geometric dimensions of precision engineered parts | Xavier Colonna De Lega, David Grigg, James F. Biegen | 2004-11-23 |
| 6778280 | Interferometry system and method employing an angular difference in propagation between orthogonally polarized input beam components | Henry A. Hill | 2004-08-17 |
| 6744522 | Interferometer for measuring the thickness profile of thin transparent substrates | Leslie L. Deck | 2004-06-01 |
| 6714307 | Measurement of complex surface shapes using a spherical wavefront | Xavier Colonna De Lega | 2004-03-30 |