Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6757056 | Combined high speed optical profilometer and ellipsometer | Steven W. Meeks | 2004-06-29 |
| 6717671 | System for simultaneously measuring thin film layer thickness, reflectivity, roughness, surface profile and magnetic pattern | Steven W. Meeks | 2004-04-06 |