Issued Patents 2004
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6781103 | Method of automatically focusing an optical beam on transparent or reflective thin film wafers or disks | Gale A. Lane | 2004-08-24 |
| 6757056 | Combined high speed optical profilometer and ellipsometer | Rusmin Kudinar | 2004-06-29 |
| 6751044 | Method and apparatus for reading a clock track with a magneto-optical clock head using the transverse Kerr effect | Richard LeSage, David S. McMurtrey, Peter R. Svendsen, W. Craig Tomalty | 2004-06-15 |
| 6717671 | System for simultaneously measuring thin film layer thickness, reflectivity, roughness, surface profile and magnetic pattern | Rusmin Kudinar | 2004-04-06 |
| 6704435 | Surface inspection tool | Wayne Isami Imaino, Anthony Juliana, Jr., Milton Russell Latta, Charles H. Lee, Wai Cheung Leung +2 more | 2004-03-09 |