KP

Kwok-Hung Grantham Pang

UK University Of Hong Kong: 2 patents #4 of 21Top 20%
Overall (2004): #53,641 of 270,089Top 20%
2
Patents 2004

Issued Patents 2004

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
6804381 Method of and device for inspecting images to detect defects Ajay Kumar 2004-10-12
6753965 Defect detection system for quality assurance using automated visual inspection Ajay Kumar 2004-06-22