Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6809539 | Probe card for testing an integrated circuit | Kouichi Wada, Takehisa Takoshima, Akira Shimokohbe | 2004-10-26 |
| 6759261 | Thin film-structure and a method for producing the same | Akira Shimokohbe | 2004-07-06 |