TT

Takehisa Takoshima

AD Advantest: 1 patents #26 of 90Top 30%
Overall (2004): #104,447 of 270,089Top 40%
1
Patents 2004

Issued Patents 2004

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6809539 Probe card for testing an integrated circuit Kouichi Wada, Akira Shimokohbe, Seiichi Hata 2004-10-26