Issued Patents 2004
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6815970 | Method for measuring NBTI degradation effects on integrated circuits | Timothy A. Rost | 2004-11-09 |
| 6709932 | Method for improving gate oxide integrity and interface quality in a multi-gate oxidation process | Anand Krishnan | 2004-03-23 |