Issued Patents 2004
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6815970 | Method for measuring NBTI degradation effects on integrated circuits | Vijay Reddy | 2004-11-09 |
| 6803295 | Versatile system for limiting mobile charge ingress in SOI semiconductor structures | Deems R. Hollingsworth | 2004-10-12 |
| 6710443 | INTEGRATED CIRCUIT PROVIDING THERMALLY CONDUCTIVE STRUCTURES SUBSTANTIALLY HORIZONTALLY COUPLED TO ONE ANOTHER WITHIN ONE OR MORE HEAT DISSIPATION LAYERS TO DISSIPATE HEAT FROM A HEAT GENERATING STRUCTURE | William R. Hunter, Bradley Young | 2004-03-23 |