YK

Young Gon Kim

AT Agilent Technologies: 1 patents #265 of 850Top 35%
📍 Daejeon, CA: #25 of 55 inventorsTop 50%
Overall (2004): #82,740 of 270,089Top 35%
1
Patents 2004

Issued Patents 2004

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6763486 Method and apparatus of boundary scan testing for AC-coupled differential data paths Benny Wing Hung Lai, Kenneth P. Parker, Jeff Rearick 2004-07-13