Issued Patents 2004
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6763486 | Method and apparatus of boundary scan testing for AC-coupled differential data paths | Benny Wing Hung Lai, Young Gon Kim, Kenneth P. Parker | 2004-07-13 |
| 6737858 | Method and apparatus for testing current sinking/sourcing capability of a driver circuit | Hugh Wallace | 2004-05-18 |
| 6721920 | Systems and methods for facilitating testing of pad drivers of integrated circuits | John G. Rohrbaugh, Shad Shepston | 2004-04-13 |
| 6715105 | Method for reducing stored patterns for IC test by embedding built-in-self-test circuitry for chip logic into a scan test access port | — | 2004-03-30 |
| 6707313 | Systems and methods for testing integrated circuits | John G. Rohrbaugh | 2004-03-16 |
| 6708139 | Method and apparatus for measuring the quality of delay test patterns | Manish Sharma | 2004-03-16 |