Issued Patents 2004
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6743715 | Dry clean process to improve device gate oxide integrity (GOI) and reliability | Juing-Yi Cheng, Yu Hwa Lee, Chin Shiung Ho | 2004-06-01 |
YH
Yu Bin Huang
Overall (2004): #80,418 of 270,089Top 30%
1
Patents 2004